ABOUT A NEW CONCEPT DIAGRAM FOR THE MEASUREMENT PROCESS AND RELATED TERMS

Автор(и)

  • F. Pavese IMGC/CNR (then merged in INRiM), Torino, Italy, Італія

DOI:

https://doi.org/10.24027/2306-7039.3А.2020.217689

Ключові слова:

measurement, concept diagram, metrological terms, systematic error, bias, prescriptive model, descriptive model

Анотація

According to a possible different method to classify random and systematic effect, and to build-up a measurement model starting from the prescriptive measurement model, a new Concept Diagram for the VIM Measurement Process is proposed.

Біографія автора

F. Pavese, IMGC/CNR (then merged in INRiM), Torino, Italy

former Research Director in Metrology

Посилання

International Vocabulary of Metrology—Basic and General Concepts and Associated Terms (VIM), 3rd edn., BIPM 2008, http://www.bipm.org/en/publications/guides/

Guide to the Expression of Uncertainty in Measurement (GUM). 1st Edition. International Organization for Standardization, Genève, Switzerland, 1993

Pavese F. On the classification in random and systematic effects. In AMCTM XI, 2018, in A.B. Forbes, N.F. Zhang, Chunovkina A.G., Eichstädt S., Pavese F. (Eds.): Advanced Mathematical and Computational Tools in Metrology and Testing XI, vol.11, Series on Advances in Mathematics for Applied Sciences vol. 89, World Scientific, Singapore, 2018, pp. 58–69

BIPM, International Vocabulary of Metrology—Basic and General Concepts and Associated Terms (VIM), 2012, http://www.bipm.org/en/publications/guides/

Guide to the Expression of Uncertainty in Measurement (GUM), 1st Edition. International Organization for Standardization, Genève, Switzerland, 1993

De Courtenay N., Grégis F. The evaluation of measurement uncertainty and its epistemological ramifications. Studies in History and Philosophy of Science 2017, https://doi.org/10.1016/j.shpsa.2017.05.003

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Опубліковано

2020-11-30