Surface analysis by XRF and XPS for the Avogadro constant and the realization of the kilogram based on silicon spheres

Автор(и)

  • Edyta Beyer Physikalisch-Technische Bundesanstalt (РТВ) Bundesallee 100, 38116 Braunschweig, Germany, Німеччина
  • Michael Kolbe Physikalisch-Technische Bundesanstalt (РТВ) Bundesallee 100, 38116 Braunschweig, Germany, Німеччина
  • Matthias Müller Physikalisch-Technische Bundesanstalt (РТВ) Bundesallee 100, 38116 Braunschweig, Germany, Німеччина
  • Erik Darlatt Physikalisch-Technische Bundesanstalt (РТВ) Bundesallee 100, 38116 Braunschweig, Germany, Німеччина

DOI:

https://doi.org/10.24027/2306-7039.1A.2017.99448

Ключові слова:

Avogadro constant, Redefinition of the SI unit kilogram, Quantitative surface analysis of silicon spheres

Анотація

The determination of the Avogadro constant for the redefinition of the SI unit kilogram as well as the eventual realization of the kilogram by monocrystalline enriched 28Si-spheres require a reliable surface analysis on silicon spheres. A novel instrumentation for the quantitative surface analysis of silicon spheres combines X-ray fluorescence spectroscopy and X-ray photoelectron spectroscopy techniques in order to enable the characterization and quantification of the oxide layer and unintentional contaminations. The analysis relies on the combination of the complementary X-ray methods. Measurements on 28Si-spheres were carried out. The surface was characterized regarding the elementary composition including the chemical binding states of the components and the mass of the surface layer

Біографія автора

Edyta Beyer, Physikalisch-Technische Bundesanstalt (РТВ) Bundesallee 100, 38116 Braunschweig, Germany

PhD Student

Посилання

Andreas B, Azuma Y, Bartl G, Becker P, Bettin H, Borys M, Busch I, Fuchs P, Fujii K, Fujimoto H, Kessler E, Krumrey M, Kuetgens U, Kuramoto N, Mana G, Massa E, Mizushima S, Nicolaus A, Picard A, Pramann A, Rienitz O, Schiel D, Valkiers S, Waseda A, Zakel S 2011 Counting the atoms in a 28Si crystal for a new kilogram definition Metrologia 48 1–13

Busch I, Azuma Y, Bettin H, Cibik L, Fuchs P, Fujii K, Krumrey M, Kuetgens U, Kuramoto N and Mizushima S 2011 Surface layer determination for the Si spheres of the Avogadro project Metrologia 48(2), 62-82

Kolbe M, Beckhoff B, Krumrey M, Ulm G 2005 Thickness determination for Cu and Ni nanolayers: Comparison of reference-free fundamental-parameter based X-ray fluorescence analysis and X-ray reflectometry Spectrochimica Acta B 60 505-510

Beckhoff B 2008 Reference-free X-ray spectrometry based on metrology using synchrotron radiation J. Anal. At. Spectrom. 23 845 – 853

Müller M, Beckhoff B, Ulm G, Kanngießer B 2006 Absolute determination of cross sections for resonant Raman scattering on silicon Phys. Rev. A 74, 012702

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Опубліковано

2017-04-20